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Scanning Probe Microscopy by Bert Voigtlander
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Scanning Probe Microscopy

Atomic Force Microscopy and Scanning Tunneling Microscopy
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Description

This book explains the operating principles of atomic force microscopy and scanning tunneling microscopy. The aim of this book is to enable the reader to operate a scanning probe microscope successfully and understand the data obtained with the microscope. The chapters on the scanning probe techniques are complemented by the chapters on fundamentals and important technical aspects. This textbook is primarily aimed at graduate students from physics, materials science, chemistry, nanoscience and engineering, as well as researchers new to the field.

Author Biography:

This book explains the operating principles of atomic force microscopy and scanning tunneling microscopy. The aim of this book is to enable the reader to operate a scanning probe microscope successfully and understand the data obtained with the microscope. The chapters on the scanning probe techniques are complemented by the chapters on fundamentals and important technical aspects. This textbook is primarily aimed at graduate students from physics, materials science, chemistry, nanoscience and engineering, as well as researchers new to the field.
Release date Australia
October 13th, 2016
Audience
  • Professional & Vocational
Edition
Softcover reprint of the original 1st ed. 2015
Illustrations
148 Illustrations, color; 41 Illustrations, black and white; XV, 382 p. 189 illus., 148 illus. in color.
Pages
382
Dimensions
155x235x21
ISBN-13
9783662505571
Product ID
26132648

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