Non-Fiction Books:

Test and Diagnosis of Analogue, Mixed-signal and RF Integrated Circuits

The system on chip approach


Paperback / softback

Customer rating

Click to share your rating 0 ratings (0.0/5.0 average) Thanks for your vote!

Share this product

Test and Diagnosis of Analogue, Mixed-signal and RF Integrated Circuits
Save $122.00
$187.99 was $309.99
or 4 payments of $47.00 with Learn more
In stock with supplier

The item is brand new and in-stock in with one of our preferred suppliers. The item will ship from the Mighty Ape warehouse within the timeframe shown below.

Usually ships within 2-3 weeks


Delivering to:

Estimated arrival:

  • Around 14-20 December using Express Delivery
    Mighty Ape can deliver this product within 1-2 business days (usually overnight) to urban centres across Australia, and some remote areas. Learn more
  • Around 17-24 December using standard courier delivery


Systems on Chip (SoC) for communications, multimedia and computer applications have recently received much international attention; one such example being the single-chip transceiver. Modern microelectronic design adopts a mixed-signal approach as a complex SoC is a mixed-signal system including both analogue and digital circuits. Automatic testing becomes crucially important to drive down the overall cost of next generation SoC devices. Test and fault diagnosis of analogue, mixed-signal and RF circuits, however, proves much more difficult than that of digital circuits due to tolerances, parasitics and nonlinearities and therefore, together with challenging tuning and calibration, remains the bottleneck for automatic SoC testing. This book provides a comprehensive discussion of automatic testing, diagnosis and tuning of analogue, mixed-signal and RF integrated circuits, and systems in a single source. The book contains eleven chapters written by leading researchers worldwide. As well as fundamental concepts and techniques, the book reports systematically the state of the arts and future research directions of these areas. A complete range of circuit components are covered and test issues are also addressed from the SoC perspective. An essential reference companion to researchers and engineers in mixed-signal testing, the book can also be used as a text for postgraduate and senior undergraduate students.

Author Biography

Yichuang Sun received his Ph.D. from the University of York and is currently Professor at the University of Hertfordshire. His research interests are in analogue and mixed-signal, RF and communication circuits, circuit testing and fault diagnosis, coding and signal detection, space-time and MIMO communications, and wireless and mobile networks. He has published three books and over 180 papers. Professor Sun has been a book series editor for the IET, guest editor of four special issues for IET journals, and Track Chair and committee member for many international conferences. He is editor of ETRI Journal of South Korea and serves on several IEEE committees.
Release date Australia
April 30th, 2008
Edited by Yichuang Sun
Country of Publication
United Kingdom
Institution of Engineering and Technology
Product ID

Customer reviews

Nobody has reviewed this product yet. You could be the first!

Write a Review

Marketplace listings

There are no Marketplace listings available for this product currently.
Already own it? Create a free listing and pay just 9% commission when it sells!

Sell Yours Here

Help & options

  • If you think we've made a mistake or omitted details, please send us your feedback. Send Feedback
  • If you have a question or problem with this product, visit our Help section. Get Help
  • Seen a lower price for this product elsewhere? We'll do our best to beat it. Request a better price
Filed under...