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Ellipsometry at the Nanoscale
Ellipsometry at the Nanoscale
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Ellipsometry at the Nanoscale

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$778.99
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Description

This book presents and introduces ellipsometry in nanoscience and nanotechnology making a bridge between the classical and nanoscale optical behaviour of materials. It delineates the role of the non-destructive and non-invasive optical diagnostics of ellipsometry in improving science and technology of nanomaterials and related processes by illustrating its exploitation, ranging from fundamental studies of the physics and chemistry of nanostructures to the ultimate goal of turnkey manufacturing control. This book is written for a broad readership: materials scientists, researchers, engineers, as well as students and nanotechnology operators who want to deepen their knowledge about both basics and applications of ellipsometry to nanoscale phenomena. It starts as a general introduction for people curious to enter the fields of ellipsometry and polarimetry applied to nanomaterials and progresses to articles by experts on specific fields that span from plasmonics, optics, to semiconductors and flexible electronics. The core belief reflected in this book is that ellipsometry applied at the nanoscale offers new ways of addressing many current needs. The book also explores forward-looking potential applications.
Release date Australia
August 23rd, 2016
Contributors
  • Edited by Kurt Hingerl
  • Edited by Maria Losurdo
Pages
730
Edition
Softcover reprint of the original 1st ed. 2013
Audience
  • Professional & Vocational
Illustrations
XXIV, 730 p.
Dimensions
156x234x38
ISBN-13
9783662519714
Product ID
25557852

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Books >
Non-Fiction >
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Science: general issues >
Scientific standards >
Mensuration & systems of measurement
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Scientific standards
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