Non-Fiction Books:

Transmission Electron Microscopy and Diffractometry of Materials

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  • Transmission Electron Microscopy and Diffractometry of Materials by Brent Fultz
  • Transmission Electron Microscopy and Diffractometry of Materials by Brent Fultz
$227.99
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Description

This book explains concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials. The fourth edition adds important new techniques of TEM such as electron tomography, nanobeam diffraction, and geometric phase analysis. A new chapter on neutron scattering completes the trio of x-ray, electron and neutron diffraction. All chapters were updated and revised for clarity. The book explains the fundamentals of how waves and wavefunctions interact with atoms in solids, and the similarities and differences of using x-rays, electrons, or neutrons for diffraction measurements. Diffraction effects of crystalline order, defects, and disorder in materials are explained in detail. Both practical and theoretical issues are covered. The book can be used in an introductory-level or advanced-level course, since sections are identified by difficulty. Each chapter includes a set of problems to illustrate principles, and the extensive Appendix includes laboratory exercises.

Author Biography:

Brent Fultz is a Professor of Materials Science and Applied Physics at California Institute of Technology, Pasadena. He is the successful co-author of a book on  Transmission Electron Microscopy and Diffractometry of Materials.   James Howe is a Professor of Materials Science and Engineering at the University of Virginia, Charlottesville. He successfully co-authored the book Transmission Electron Microscopy and Diffractometry of Materials.
Release date Australia
November 9th, 2014
Audience
  • Professional & Vocational
Edition
4th ed. 2013
Illustrations
XX, 764 p.
Pages
764
Dimensions
155x235x40
ISBN-13
9783642433153
Product ID
23814290

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