Analog IC Reliability in Nanometer CMOS

Name: Analog IC Reliability in Nanometer CMOS
SKU: 20935649
Price: 270.99 AUD
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Hardback

Series:

Analog Circuits and Signal Processing

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Description

This book focuses on modeling, simulation and analysis of analog circuit aging. First, all important nanometer CMOS physical effects resulting in circuit unreliability are reviewed. Then, transistor aging compact models for circuit simulation are discussed and several methods for efficient circuit reliability simulation are explained and compared. Ultimately, the impact of transistor aging on analog circuits is studied. Aging-resilient and aging-immune circuits are identified and the impact of technology scaling is discussed. The models and simulation techniques described in the book are intended as an aid for device engineers, circuit designers and the EDA community to understand and to mitigate the impact of aging effects on nanometer CMOS ICs.

Release date Australia

January 9th, 2013

Author

Audience

Professional & Vocational

Illustrations

XVI, 198 p.

Pages

198

Series

Analog Circuits and Signal Processing

Dimensions

155x235x18

ISBN-13

9781461461623

Product ID

20935649

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