Digital and Analogue Instrumentation

Testing and measurement

By:

Nihal Kularatna

Format:

Hardback

Series:

Materials, Circuits and Devices

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Description

A state-of-the-art review of modern families of digital instruments. For each family, the author covers internal design, use and applications, highlighting their advantages and limitations from a practical application viewpoint. New enabling semiconductor technology offers new capabilities to instrument designers and the text treats digital instrument families including data converters, signal processors and modern sensors. This title is an update of the author's earlier work, "Modern Electronic Test and Measuring Instruments".

Author Biography:

Nihal Kularatna is a Senior Lecturer at the Department of Electrical & Electronic Engineering at the University of Auckland, New Zealand. From 1986 to 2000 he developed a research and development base at the Arthur C. Clarke Institute for Modern Technologies in Sri Lanka where he was a Principal Research Engineer and subsequently CEO (2000-2001). He has published over 50 papers and is the author of three books. He is a Fellow of the IET.

Release date Australia

October 25th, 2002

Author

Nihal Kularatna

Audiences

Postgraduate, Research & Scholarly
Professional & Vocational
Technical / Manuals
Undergraduate

Pages

675

Series

Materials, Circuits and Devices

ISBN-13

9780852969991

Product ID

4356005

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