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Failure Analysis of Integrated Circuits on Hardback
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Failure Analysis of Integrated Circuits

Tools and Techniques
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Description

Failure Analysis of Integrated Circuits: Tools and Techniques provides a basic understanding of how the most commonly used tools and techniques in silicon-based semiconductors are applied to understanding the root cause of electrical failures in integrated circuits. These include applications specific to performing failure analysis such as decapsulation, deprocessing, and fail site isolation, as well as physical and chemical analysis tools and techniques. The coverage is qualitative, and it provides a general understanding for making intelligent tool choices. Also included is coverage of the shortcomings, limitations, and strengths of each technique. Failure Analysis of Integrated Circuits: Tools and Techniques is a `must have' reference work for semiconductor professionals and researchers.
Release date Australia
January 31st, 1999
Audience
  • Professional & Vocational
Contributor
  • Edited by Lawrence C. Wagner
Illustrations
XIII, 255 p.
Pages
255
Dimensions
155x235x17
ISBN-13
9780412145612
Product ID
2050476

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