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High-Resolution X-Ray Scattering by Vaclav Holy
High-Resolution X-Ray Scattering by Vaclav Holy
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High-Resolution X-Ray Scattering

From Thin Films to Lateral Nanostructures
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Description

The book presents a detailed description of high-resolution x-ray scattering methods suitable for the investigation of the real structure of single-crystalline layers and multilayers, including structure defects in the layers and at the interfaces. Particular attention is devoted to lateral structures in semiconductors and semiconductor multilayers such as quantum wires and quantum dots. Both the theoretical background and the application of the methods are discussed. The second edition is extended to deal with lateral surface nanostructures such as gratings and dots, new examples for measuring layer thickness, lattice mismatch, and surface/interface roughness. The book will be an invaluable source for graduates and scientists.
Release date Australia
December 12th, 2011
Audience
  • Professional & Vocational
Edition
2nd ed. 2004. Softcover reprint of the original 2nd ed. 2004
Illustrations
389 Illustrations, black and white; XVI, 408 p. 389 illus.
Pages
408
Dimensions
155x235x22
ISBN-13
9781441923073
Product ID
10817470

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