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Kelvin Probe Force Microscopy

Measuring and Compensating Electrostatic Forces
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Description

Over the nearly 20 years of Kelvin probe force microscopy, an increasing interest in the technique and its applications has developed. This book gives a concise introduction into the method and describes various experimental techniques. Surface potential studies on semiconductor materials, nanostructures and devices are described, as well as application to molecular and organic materials. The current state of surface potential at the atomic scale is also considered. This book presents an excellent introduction for the newcomer to this field, as much as a valuable resource for the expert.
Release date Australia
October 22nd, 2011
Audience
  • Children / Juvenile
Contributors
  • Edited by Sascha Sadewasser
  • Edited by Thilo Glatzel
Illustrations
XIV, 334 p.
Pages
334
Dimensions
155x235x25
ISBN-13
9783642225659
Product ID
11485655

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