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Modern Interferometry for Length Metrology on Hardback
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Modern Interferometry for Length Metrology

Exploring limits and novel techniques
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Description

Modern Interferometry for Length Metrology: Exploring limits and novel techniques gives an overview of refined traditional methods and novel techniques in the field of length and distance metrology. The representation of a length according to the definition of the meter in the International System of Units (SI) requires a measurement principle that establishes a relation between the travelling time of light in vacuum and the length to be measured. This comprehensive book covers the basic concepts of length metrology, sophisticated methods to reach smallest measurement uncertainties in length measurements and innovative interferometer concepts. Aimed at students, researchers and practitioners in the field, this book will provide a far-reaching audience with key data, enabling them to better apply and understand interferometry and length metrology.

Author Biography:

Modern Interferometry for Length Metrology: Exploring limits and novel techniques has been written by leading experts within the field of metrology and edited by René Schӧdel who is the head of the Department of Interferometry on Material Measures at the Physikalisch-Technische Bundesanstalt (PTB). Schӧdel is highly engaged in fields of optical interferometry and length metrology, and he has contributed significant findings and practical applications to this book along with the co-authors. Contributing their expert knowledge to the work are Florian Pollinger, Arnold Nicolaus, Guido Bartl, Thilo Schuldt, Nandini Bhattacharya, Steven van den Berg, Seung-Woo Kim, Yoon-Soo Jang, Armin Reichhold, Birk Andreas and Christoph Weichert.
Release date Australia
December 21st, 2018
Audience
  • Professional & Vocational
Contributors
  • Contributions by Armin Reichhold
  • Contributions by Arnold Nicolaus
  • Contributions by Florian Pollinger
  • Contributions by Guido Bartl
  • Contributions by Nandini Bhattacharya
  • Contributions by Seung-Woo Kim
  • Contributions by Steven van den Berg
  • Contributions by Thilo Schuldt
  • Contributions by Yoon-Soo Jang
  • Edited by René Schödel
Illustrations
With figures in colour and in black and white
Pages
324
Dimensions
178x254x19
ISBN-13
9780750315760
Product ID
28124488

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