Scanning Electron Microscopy

Physics of Image Formation and Microanalysis

By:

Ludwig Reimer

Format:

Hardback

Series:

Springer Series in Optical Sciences

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Description

Scanning Electron Microscopy provides a description of the physics of electron-probe formation and of electron-specimen interactions. The different imaging and analytical modes using secondary and backscattered electrons, electron-beam-induced currents, X-ray and Auger electrons, electron channelling effects, and cathodoluminescence are discussed to evaluate specific contrasts and to obtain quantitative information.

Release date Australia

September 17th, 1998

Author

Ludwig Reimer

Audiences

Postgraduate, Research & Scholarly
Professional & Vocational

Contributor

Guest editor P.W. Hawkes

Edition

2nd completely rev. and updated ed. 1998

Illustrations

XIV, 529 p.

Pages

529

Series

Springer Series in Optical Sciences

Dimensions

156x234x30

ISBN-13

9783540639763

Product ID

2495145

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