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Speckle Metrology on Hardback by SIROHI
Speckle Metrology on Hardback by SIROHI
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Speckle Metrology

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Description

This practical reference offers state-of-the-art coverage of speckle metrology and its value as a measuring technique in industry. Examing every important aspect of the field, "Speckle Metrology": surveys the origin of speckle displacement and decorrelation; presents procedures for deformation analysis and shape measurement of rough objects; explains particle image velocimetry (PIV), the processing of PIV records, and the design requirements of PIV equipment; discusses the applications of white light speckle methods and the production of artificial speckles; describes the measurement of surface roughness with laser speckles and polychromatic speckles; illustrates semiautomatic and automatic methods for the analysis of Young's fringes; calculates the variation of Young's fringes with the change in the microrelief of the rough surface; and explicates hololenses for imaging and provides design details with aberration corrections for hololense systems. With over 1500 literature citations, tables, figures and display equations, "Speckle Metrology" is a resource for students and professionals in the fields of optical, mechanical, electrical and electronics engineering; applied physics; and stress analysis.
Release date Australia
May 20th, 1993
Author
Audiences
  • Professional & Vocational
  • Technical / Manuals
Pages
572
ISBN-13
9780824789329
Product ID
33297682

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